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SEDLÁKOVÁ, V.
Originální název
Electro-ultrasonic Spectroscopy of Polymer Based and Cermet Thick Film Resistors
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
We have studied the quality of polymer based and cermet thick film layers. The samples were made using different resistive and conducting pastes and dipping silvers. We have applied new principle for non-destructive testing of conducting solids which is based on the phonon interaction with conducting electrons. The ultrasonic signal changes the contact area between conducting grains and then resistance is modulated by frequency of ultrasonic excitation. Resultant intermodulation voltage depends on the value of ac current varying with frequency fE and on the ultrasonic excited resistance change ?R varying with frequency fU. The intermodulation component of frequency fm = fE - fU varies linearly with electric excitation. The dependence of the intermodulation component on the ultrasonic excitation is influenced by the resistive layer material. The amplitude of the intermodulation component Um is proportional to the ultrasonic voltage UU a, with the power a=0.7 to 2. For high values of ultrasonic excitation the saturation of Um is observed. We have used the short current pulse from capacitor discharge as a stressing method for resistor degradation. The amplitude of intermodulation component increases after resistor degradation. The method can be used a diagnostic tool for thick film resistor quality and reliability assessment.
Klíčová slova
Electro-Ultrasonic Spectroscopy, Cermet, Polymer Based, Thick Film Resistors
Autoři
Rok RIV
2007
Vydáno
1. 1. 2007
Nakladatel
IMAPS Nordic
Místo
Finsko
Strany od
450
Strany do
455
Strany počet
6
BibTex
@inproceedings{BUT27976, author="Vlasta {Sedláková}", title="Electro-ultrasonic Spectroscopy of Polymer Based and Cermet Thick Film Resistors", booktitle="Proceedings EMPC 2007", year="2007", pages="450--455", publisher="IMAPS Nordic", address="Finsko" }