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BOUŠEK, J.
Originální název
PC controled equipment for FAST TRANSIENTS TESTING OF SILICON SOLAR CELLS
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
A simple method using fast transients has been suggested and demonstrated for the set of different quality photovoltaic cells. New approach uses PC controlled equipment. Cells parameters as the reverse breakdown voltage, depletion layer width and junction capacitance, serial and parallel resistance and lifetime of minority carriers in bulk can be taken easily. To suppress the influence of the depletion layer capacitance voltage bias was set by the dark current excitation.
Klíčová slova
crystalline silicon solar cells, minority carrier lifetime, breakdown voltage
Autoři
Rok RIV
2007
Vydáno
20. 9. 2007
Nakladatel
nakl. Ing. Zdeněk Novotný, Brno
ISBN
978-80-214-3470-7
Kniha
Electronic Devices and Systems, EDS´07 PROCEEDINGS 2
Číslo edice
2
Strany od
415
Strany do
420
Strany počet
6
BibTex
@inproceedings{BUT28210, author="Jaroslav {Boušek}", title="PC controled equipment for FAST TRANSIENTS TESTING OF SILICON SOLAR CELLS", booktitle="Electronic Devices and Systems, EDS´07 PROCEEDINGS 2", year="2007", number="2", pages="415--420", publisher="nakl. Ing. Zdeněk Novotný, Brno", isbn="978-80-214-3470-7" }