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ANDREEV, A. ZAJAČEK, J. GRMELA, L. HOLCMAN, V.
Originální název
Low Frequency Noise Measuring in Semiconductor Devices
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The noise spectroscopy in time and frequency domain is one of the promising methods to provide a non-destructive evaluation of semiconductor materials and devices. This work proposes a method for fast performance noise PSD measurements. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed. In the very low frequency area we will obtain high resolution. The usage of this method reduces background noise of measuring setup.
Klíčová slova
Low frequency noise, polovodic
Autoři
ANDREEV, A.; ZAJAČEK, J.; GRMELA, L.; HOLCMAN, V.
Rok RIV
2007
Vydáno
12. 8. 2007
Nakladatel
Dr. Laszlo Lehoczky
Místo
Miskolc, Hungary
ISBN
978-963-661-783-7
Kniha
6th International Conference of PhD Students
Edice
Číslo edice
1
Strany od
179
Strany do
184
Strany počet
6
BibTex
@inproceedings{BUT28507, author="Alexey {Andreev} and Jiří {Zajaček} and Lubomír {Grmela} and Vladimír {Holcman}", title="Low Frequency Noise Measuring in Semiconductor Devices", booktitle="6th International Conference of PhD Students", year="2007", series="Dr. Laszlo Lehoczky", number="1", pages="179--184", publisher="Dr. Laszlo Lehoczky", address="Miskolc, Hungary", isbn="978-963-661-783-7" }