Detail publikace

Device for statistical characteristics of microplasma noise measurment

MACKŮ, R. KOKTAVÝ, P.

Originální název

Device for statistical characteristics of microplasma noise measurment

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Random two-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. Based on experiment results, a two-state model of stochastic generation-recombination process has been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. A device for measurement of statistical characteristics in a wide range of time is described in this paper. Thus obtained results may be used for p-n junction non-destructive diagnostics and quality assessment.

Klíčová slova

Microplasma noise, Statistical characteristics, A-type noise, Impulse duration, Impulse separation

Autoři

MACKŮ, R.; KOKTAVÝ, P.

Rok RIV

2007

Vydáno

15. 11. 2007

Nakladatel

Z. Novotný, Ing., CSc.

Místo

Brno

ISBN

978-80-7355-078-3

Kniha

New trends in physics

Edice

-

Číslo edice

první

Strany od

90

Strany do

93

Strany počet

4

BibTex

@inproceedings{BUT28511,
  author="Robert {Macků} and Pavel {Koktavý}",
  title="Device for statistical characteristics of microplasma noise measurment",
  booktitle="New trends in physics",
  year="2007",
  series="-",
  number="první",
  pages="90--93",
  publisher="Z. Novotný, Ing., CSc.",
  address="Brno",
  isbn="978-80-7355-078-3"
}