Detail publikace

Cold Emission Cathodes Noise Characteristics

KNÁPEK, A.

Originální název

Cold Emission Cathodes Noise Characteristics

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper introduces a method for deposition thick oxide layer on to the cold emission cathode and its noise diagnostics. Cathodes based on the Schottky emission are predominant electron source technology for scanning electron microscopy (SEM), transmission electron microscopy (TEM) and Auger systems. Achieving proper results requires an electron source with the following ideal properties: small source size, low electron emission energy spread, high brightness, low noise and long-term stability, simple and low-cost operation. Deposited oxide layer allows to significantly lower work function, which is necessary for increasing cold electron emission current.

Klíčová slova

coldemission cathode, noise diagnostics, electron source

Klíčová slova v angličtině

coldemission cathode, noise diagnostics, electron source

Autoři

KNÁPEK, A.

Rok RIV

2010

Vydáno

29. 4. 2010

Nakladatel

NOVPRESS s.r.o

Místo

Brno, 2010

ISBN

978-80-214-4080-7

Kniha

Proceedings of the 16th Conference Student EEICT 2010

Edice

Volume 5

Číslo edice

první

Strany od

94

Strany do

98

Strany počet

5

BibTex

@inproceedings{BUT29903,
  author="Alexandr {Knápek}",
  title="Cold Emission Cathodes Noise Characteristics",
  booktitle="Proceedings of the 16th Conference Student EEICT 2010",
  year="2010",
  series="Volume 5",
  number="první",
  pages="94--98",
  publisher="NOVPRESS s.r.o",
  address="Brno, 2010",
  isbn="978-80-214-4080-7"
}