Detail publikace

Loss in the near-field optical microscopy due to the tapered probe

TOMÁNEK, P. ŠKARVADA, P.

Originální název

Loss in the near-field optical microscopy due to the tapered probe

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Near-field optical techniques are presently widely used to study various optical characteristics of transparent or opaque microscopic structures such as optical waveguides, photonic crystals, semiconductor junctions, nanostructured systems. To control a light-matter interaction at nanometer distance, structures guiding electromagnetic energy with lateral mode confinement below the diffraction limit of light are necessary. Tapered tiny optical fiber probe is a crucial part of the system, governs its resolution, and simultaneously could play role as light source, detector, or both. Therefore it must be protected against mechanical vibration, cracks, etc. For its accurate simulation, it is essential that its geometry is correctly described, especially when coupling to evanescent field is considered.

Klíčová slova

near field, optics, taper, dielectric coating

Autoři

TOMÁNEK, P.; ŠKARVADA, P.

Rok RIV

2009

Vydáno

15. 10. 2009

Nakladatel

Technical University Košice

Místo

Košice, Slovensko

ISBN

978-80-8086-122-3

Kniha

Proceedings Physics of Materials 09

Strany od

119

Strany do

122

Strany počet

4

BibTex

@inproceedings{BUT32400,
  author="Pavel {Tománek} and Pavel {Škarvada}",
  title="Loss in the near-field optical microscopy due to the tapered probe",
  booktitle="Proceedings Physics of Materials 09",
  year="2009",
  pages="119--122",
  publisher="Technical University Košice",
  address="Košice, Slovensko",
  isbn="978-80-8086-122-3"
}