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MACKŮ, R. KOKTAVÝ, P.
Originální název
Improved electrical characterization of silicon solar cells based on noise spectroscopy in forward direction
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
This paper analyses in detail the issue of non-destructive testing of n+p silicon solar cells. Their extremely large junctions contain lots of defect regions which deteriorate the properties of the whole solar cells. In the present work, we carried out experiments and theoretical description for the bulk inhomogeneity of the samples qualification. We propose an equivalent circuit model for the current-voltage characteristics of forward biased n+p solar cells, too. The model takes into account leakage current, series resistance and different mechanisms of charge transport. Spread series resistance issue of a solar cell front contact has been discussed and experimentally demonstrated. The electrical model admits analytical solution using e.g. the Lambert W-function and it has been tested for some spices of a solar cell in forward direction. Last but not least we use obtained information for description of the samples noise behaviour and we suggest noise model containing flicker noise, shot noise and G-R noise variant.
Klíčová slova
Noise Spectroscopy, Silicon Solar Cell, Non-destructive Testing
Autoři
MACKŮ, R.; KOKTAVÝ, P.
Rok RIV
2009
Vydáno
21. 10. 2010
Nakladatel
WIP-Renewable Energies
ISBN
3-936338-24-8
Kniha
Proceedings of 24rd European Photovoltaic Solar Energy Conference
Strany od
484
Strany do
488
Strany počet
4
BibTex
@inproceedings{BUT32871, author="Robert {Macků} and Pavel {Koktavý}", title="Improved electrical characterization of silicon solar cells based on noise spectroscopy in forward direction", booktitle="Proceedings of 24rd European Photovoltaic Solar Energy Conference", year="2010", pages="484--488", publisher="WIP-Renewable Energies", isbn="3-936338-24-8" }