Detail publikace

Intelligent IGBT driver concept for three-phase electric drive diagnostics

KLÍMA, B. KNOBLOCH, J. POCHYLA, M.

Originální název

Intelligent IGBT driver concept for three-phase electric drive diagnostics

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This document focuses on the problem of diagnostics of an electrical drive equipped with a voltage source inverter (VSI). The attention is oncentrated on a hardware design for a power system diagnostics. A new concept of a power transistor driver is proposed. This concept of the driver integrates functions for monitoring of a large number of electrical drive parameters which are transferred to the superior control system for an actual operation state evaluation or an eventual failure state detection. The proposed solution introduces the possibility of an internal electrical quantities feedback realization (phase currents and DC link voltage) directly in the drivers of power transistors without using standard current and voltage sensors. The feed-backs can be extended with output voltages measurement of the inverter which can be further used in online identification of motor parameters for a model of the electrical drive. This model can be used for a control technique adaptation (with respect to maximal efficiency, maximal dynamic performance or also for sensor-less speed control or position control).

Klíčová slova

electric drive diagnostics, failure mode, IGBT driver, parameter identification

Autoři

KLÍMA, B.; KNOBLOCH, J.; POCHYLA, M.

Rok RIV

2010

Vydáno

14. 4. 2010

Nakladatel

IEEE

Místo

Vídeň

ISBN

978-1-4244-6610-8

Kniha

Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electrical Circuits and Systems

Číslo edice

1

Strany od

217

Strany do

220

Strany počet

4

BibTex

@inproceedings{BUT33426,
  author="Bohumil {Klíma} and Jan {Knobloch} and Martin {Pochyla}",
  title="Intelligent IGBT driver concept for three-phase electric drive diagnostics",
  booktitle="Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electrical Circuits and Systems",
  year="2010",
  number="1",
  pages="217--220",
  publisher="IEEE",
  address="Vídeň",
  isbn="978-1-4244-6610-8"
}