Detail publikace

Diagnostics of Forward Biased Silicon Solar Cells Using Noise Spectroscopy

MACKŮ, R. KOKTAVÝ, P. ŠKARVADA, P. RAŠKA, M. SADOVSKÝ, P.

Originální název

Diagnostics of Forward Biased Silicon Solar Cells Using Noise Spectroscopy

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Our research is above all focused on non-destructive testing of the solar cells. We study a single-crystal silicon solar cells n+p and we don't have serious information about features of a pn junction and impurities distribution. The main point of our study is characterization of the local defects in samples. These defects lead to live-time reduction and degradation of reliability. Flicker noise in forward biased solar cells is subject of this paper. We will discuss our measurement with Kleinpenning approaches for inhomogeneous semiconductors and we suggest the physical nature of the samples behaviour.

Klíčová slova

Solar cell, flicker noise, shot noise, transport mechanism

Autoři

MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P.; RAŠKA, M.; SADOVSKÝ, P.

Rok RIV

2009

Vydáno

14. 6. 2009

Nakladatel

American Institute of Physics

Místo

U.S.A.

ISBN

978-0-7354-0665-0

Kniha

Noise and Fluctuations, ICNF 2009

ISSN

0094-243X

Periodikum

AIP conference proceedings

Ročník

1129

Číslo

1

Stát

Spojené státy americké

Strany od

145

Strany do

148

Strany počet

4

BibTex

@inproceedings{BUT34758,
  author="Robert {Macků} and Pavel {Koktavý} and Pavel {Škarvada} and Michal {Raška} and Petr {Sadovský}",
  title="Diagnostics of Forward Biased Silicon Solar Cells Using Noise Spectroscopy",
  booktitle="Noise and Fluctuations, ICNF 2009",
  year="2009",
  journal="AIP conference proceedings",
  volume="1129",
  number="1",
  pages="145--148",
  publisher="American Institute of Physics",
  address="U.S.A.",
  isbn="978-0-7354-0665-0",
  issn="0094-243X"
}