Detail publikace

Light emission from silicon solar cells as characterization technique

ŠKARVADA, P. TOMÁNEK, P. KOKTAVÝ, P. MACKŮ, R.

Originální název

Light emission from silicon solar cells as characterization technique

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper describes local photoelectric measurement results obtained with monocrystalline silicon solar cell in visible light. The measurement allows localize, with high spatial resolution, a weak light emission from defects at reverse bias voltage as low as 3 V, which does not exhibit any relation to current-voltage characteristics (no local breakdowns). Other types of defects observed under forward bias using electroluminescence (EL) and light induced beam current (LBIC) techniques are also visualized. The measurements should contribute to find a correlation between EL and modified LBIC results.

Klíčová slova

silicon solar cell; characterization; light emission; defects

Autoři

ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.; MACKŮ, R.

Rok RIV

2010

Vydáno

19. 5. 2010

Nakladatel

Reprotechnika Wroclaw

Místo

Wroclaw

ISBN

978-1-4244-5371-9

Kniha

2010 9th International Conference on Environment and Electrical Engineering

Strany od

97

Strany do

100

Strany počet

4

BibTex

@inproceedings{BUT35588,
  author="Pavel {Škarvada} and Pavel {Tománek} and Pavel {Koktavý} and Robert {Macků}",
  title="Light emission from silicon solar cells as characterization technique",
  booktitle="2010 9th International Conference on Environment and Electrical Engineering",
  year="2010",
  pages="97--100",
  publisher="Reprotechnika Wroclaw",
  address="Wroclaw",
  isbn="978-1-4244-5371-9"
}