Detail publikace

Transport and noise quality indicators for PN junction diodes

HRUŠKA, P., KOKTAVÝ, B., VAŠINA, P., NAVAROVÁ, H., JURÁNKOVÁ, J., ŠIKULA, J.

Originální název

Transport and noise quality indicators for PN junction diodes

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Introduced a set of transport and a set of noise quality indicators. Comparison of the sets efficiency when a large group of GaAsP diodes were examined. Earlier detection of failing samples with a noise indicator.

Klíčová slova

Quality indicators, transport in PN junctions, noise in PN junctions, ageing process in PN junction

Autoři

HRUŠKA, P., KOKTAVÝ, B., VAŠINA, P., NAVAROVÁ, H., JURÁNKOVÁ, J., ŠIKULA, J.

Vydáno

4. 10. 1994

Nakladatel

QaRel

Místo

Glasgow, Scotland

Strany od

581

Strany do

584

Strany počet

4

BibTex

@inproceedings{BUT3706,
  author="Pavel {Hruška} and Bohumil {Koktavý} and Pavel {Vašina} and Hana {Navarová} and Jana {Juránková} and Josef {Šikula}",
  title="Transport and noise quality indicators for PN junction diodes",
  booktitle="5th European Symposium on Reliability of Electron Devives, Failure Physics and Analysis",
  year="1994",
  number="1",
  pages="4",
  publisher="QaRel",
  address="Glasgow, Scotland"
}