Detail publikace

Nonlinearity and noise of thick film resistors as reliability indicators

ŠIKULA, J. KOKTAVÝ, B. KOKTAVÝ, P. PAVELKA, J. ROČAK, D. BELAVIČ, D.

Originální název

Nonlinearity and noise of thick film resistors as reliability indicators

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

A nonlinearity and noise of thick film resistors made with DuPont resistor pastes 2041 and 8039 were used to make prediction of resistor reliability. The influence of resistor dimension and termination Ag/Pd was evaluated.

Klíčová slova v angličtině

nonlinearity, noise, thick film

Autoři

ŠIKULA, J.; KOKTAVÝ, B.; KOKTAVÝ, P.; PAVELKA, J.; ROČAK, D.; BELAVIČ, D.

Rok RIV

2004

Vydáno

1. 1. 1998

Nakladatel

Electronic Components Institute Internationale Ltd.

Místo

UK

Strany od

56

Strany do

61

Strany počet

6

BibTex

@inproceedings{BUT4093,
  author="Josef {Šikula} and Bohumil {Koktavý} and Pavel {Koktavý} and Jan {Pavelka} and Dubravka {Ročak} and Darko {Belavič}",
  title="Nonlinearity and noise of thick film resistors as reliability indicators",
  booktitle="Proceedings of 12th European Passive Components Symposium CARTS-Europe '98",
  year="1998",
  pages="6",
  publisher="Electronic Components Institute Internationale Ltd.",
  address="UK"
}