Detail publikace

New Scratch Tester Developed for Plasma Polymer Characterization

PŘIKRYL, R., SALYK, O., KŘÍPAL, L., ČECH, V.

Originální název

New Scratch Tester Developed for Plasma Polymer Characterization

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

A fully PC-controlled scratch tester was developed for testing of adhesion between the film and the substrate. The Rockwell ball or the diamond tip is driven over the film surface to produce a scratch in this film. The load on the ball (tip) is linearly increased and the value of the load, at which adhesion failure is detected, is known as the critical load between the film and the substrate. The apparatus was constructed and optimized for polymer films with respect to the force range and sensitivity. The plot of normal and lateral force is recorded and analyzed in order to obtain the critical load value. The optical polarizing and the atomic force microscopy enabled to analyze the scratch path.

Klíčová slova v angličtině

adhesion, scratch, thin film, plasma polymer

Autoři

PŘIKRYL, R., SALYK, O., KŘÍPAL, L., ČECH, V.

Vydáno

1. 1. 2002

ISSN

0011-4626

Periodikum

Czechoslovak Journal of Physics

Ročník

2002

Číslo

52 D (2002)

Stát

Česká republika

Strany od

824

Strany do

828

Strany počet

5

BibTex

@article{BUT41222,
  author="Radek {Přikryl} and Ota {Salyk} and Lukáš {Křípal} and Vladimír {Čech}",
  title="New Scratch Tester Developed for Plasma Polymer Characterization",
  journal="Czechoslovak Journal of Physics",
  year="2002",
  volume="2002",
  number="52 D (2002)",
  pages="5",
  issn="0011-4626"
}