Detail publikace

Process Characterization and Description in Order to Reliability Assessment

NOVOTNÝ, R.

Originální název

Process Characterization and Description in Order to Reliability Assessment

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.

Klíčová slova

analysis, variation, quantification, experiment, optimization, factor, response, design

Autoři

NOVOTNÝ, R.

Rok RIV

2008

Vydáno

1. 1. 2008

Nakladatel

Naun.org

ISSN

1998-4464

Periodikum

International Journal of Circuits Systems and Signal Processing

Ročník

2007

Číslo

4

Stát

Spojené státy americké

Strany od

303

Strany do

309

Strany počet

7

BibTex

@article{BUT49207,
  author="Radovan {Novotný}",
  title="Process Characterization and Description in Order to Reliability Assessment",
  journal="International Journal of Circuits Systems and Signal Processing",
  year="2008",
  volume="2007",
  number="4",
  pages="303--309",
  issn="1998-4464"
}