Detail publikace

Test Electronic Devices for Acceptability by Lot Acceptance Sampling

NOVOTNÝ, R.

Originální název

Test Electronic Devices for Acceptability by Lot Acceptance Sampling

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Particularly in the manufacture of electronic devices one of the most important tasks of quality management is the efficient and effective control to assure the ability to deliver a reliable product. To determine the failure rate, mean life or reliability of any devices, an adequately large sample size is required, a large number of tests need to be conducted over a wide range of conditions that include burn-in tests and simulate system enviroments. Plans for reability and life testing are usually destructive in nature. For this reason, some form of sampling inspection for reliability evaluation is required.

Klíčová slova

reliability, acceptance sampling, electronic devices

Autoři

NOVOTNÝ, R.

Rok RIV

2002

Vydáno

1. 1. 2002

Nakladatel

Vysoké učení technické v Brně

Místo

Brno

ISBN

80-214-2180-0

Kniha

ELECTRONIC DEVICES AND SYSTEMS 02 - PROCEEDINGS

Číslo edice

1.

Strany od

399

Strany do

402

Strany počet

4

BibTex

@inproceedings{BUT4966,
  author="Radovan {Novotný}",
  title="Test Electronic Devices for Acceptability by Lot Acceptance Sampling",
  booktitle="ELECTRONIC DEVICES AND SYSTEMS 02 - PROCEEDINGS",
  year="2002",
  number="1.",
  pages="4",
  publisher="Vysoké učení technické v Brně",
  address="Brno",
  isbn="80-214-2180-0"
}