Detail publikace

Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells

GRMELA, L. ŠKARVADA, P. TOMÁNEK, P. MACKŮ, R. SMITH, S.

Originální název

Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

The quality and lifetime of solar cells depends critically on both bulk and surface imperfections. When a solar cell is reverse-biased with low voltage, weak emission from imperfections appears. A scanning measurement using a high sensitivity light detection technique utilizing Scanning near-field optical microscope with cooled PMT in the photon counting regime allows non-destructive detection and localization of light-emitting centers originating from imperfections in the cell. We have found that the emission from these imperfections exhibits unique thermal characteristics. As consequence, the thermal characteristics can distinguish among several kinds of imperfections in monocrystalline silicon solar cells.

Klíčová slova

Si solar cell, thermal characteristics, local measurement, high resolution

Autoři

GRMELA, L.; ŠKARVADA, P.; TOMÁNEK, P.; MACKŮ, R.; SMITH, S.

Rok RIV

2012

Vydáno

22. 1. 2012

Nakladatel

Elsevier

Místo

North-Holland

ISSN

0927-0248

Periodikum

SOLAR ENERGY MATERIALS AND SOLAR CELLS

Ročník

96

Číslo

1

Stát

Nizozemsko

Strany od

108

Strany do

111

Strany počet

4

BibTex

@article{BUT49824,
  author="Lubomír {Grmela} and Pavel {Škarvada} and Pavel {Tománek} and Robert {Macků} and Steve J. {Smith}",
  title="Local investigation of thermal dependence of light emission from reverse-biased monocrystalline silicon solar cells",
  journal="SOLAR ENERGY MATERIALS AND SOLAR CELLS",
  year="2012",
  volume="96",
  number="1",
  pages="108--111",
  issn="0927-0248"
}