Detail publikace

Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure

MACKŮ, R. KOKTAVÝ, P. ŠKARVADA, P.

Originální název

Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure

Typ

článek v časopise - ostatní, Jost

Jazyk

angličtina

Originální abstrakt

This article discusses the issue of noise measurements application for the quality assessment of the solar cells themselves and production technology alike. The main focus of our research is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise was found to be in a direct consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the pn junction. Non-destructive measurement methodology as presented here is suitable for testing of a large number of various semiconductor devices not only for solar cells. In this paper experimental measurement of noise signals in the frequency and time domain is presented. Furthermore the microplasma noise behaviour and defect geometry is discussed.

Klíčová slova

Solar cell, Microplasma noise, Non-destructive testing, Local defect

Autoři

MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P.

Rok RIV

2011

Vydáno

10. 1. 2011

Nakladatel

Trans Tech Publications

Místo

Switzerland

ISSN

1013-9826

Periodikum

Key Engineering Materials (print)

Ročník

465

Číslo

1

Stát

Švýcarská konfederace

Strany od

314

Strany do

317

Strany počet

4

BibTex

@article{BUT50266,
  author="Robert {Macků} and Pavel {Koktavý} and Pavel {Škarvada}",
  title="Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure",
  journal="Key Engineering Materials (print)",
  year="2011",
  volume="465",
  number="1",
  pages="314--317",
  issn="1013-9826"
}