Detail publikace

Local light to electric energy conversion measurement of silicon solar cells

ŠKARVADA, P. TOMÁNEK, P.

Originální název

Local light to electric energy conversion measurement of silicon solar cells

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper is focused on non-destructive detection of structural errors, and on local illumination to electric energy conversion measurement in the solar cell using a near-field optical scanning microscope (SNOM). The principal objective of this study is to find out a relationship between surface or structure errors and defects observed in electric characteristics of solar cell samples. The defects and local mechanical damage of Si solar cell can result in lower light to electric energy conversion efficiency. The influence of surface scratching on reverse I-V characteristics of single-crystal silicon solar cell is also presented. The topography measurement, local surface reflection and local light to electric energy conversion measurement in areas damaged by a scratch are also provided.

Klíčová slova

Scanning near-field optical microscope, local light to electric energy conversion measurement, reflection, solar cell

Autoři

ŠKARVADA, P.; TOMÁNEK, P.

Rok RIV

2008

Vydáno

7. 5. 2008

Nakladatel

Zsolt Illyefalvi-Vitéz, Bálint Balogh

Místo

Hungary, Budapest

ISBN

978-963-06-4915-5

Kniha

Reliability and Life-time Prediction, Conference Proceedings

Číslo edice

1

Strany od

101

Strany do

104

Strany počet

4

BibTex

@inproceedings{BUT5034,
  author="Pavel {Škarvada} and Pavel {Tománek}",
  title="Local light to electric energy conversion measurement of silicon solar cells",
  booktitle="Reliability and Life-time Prediction, Conference Proceedings",
  year="2008",
  number="1",
  pages="101--104",
  publisher="Zsolt Illyefalvi-Vitéz, Bálint Balogh",
  address="Hungary, Budapest",
  isbn="978-963-06-4915-5"
}