Detail publikace

Optimisation of the burn-in process

NOVOTNÝ, R., BRADÍK, J.

Originální název

Optimisation of the burn-in process

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The reliability of electronic devices constitutes an important aspect of quality control. Burn-in is an accelerated screening procedure that eliminates infant mortalities early on in the shop before shipping out the devices to the customers. Burn-in is screening premature failure at high temperature and high electrical loading. The design of experiments using sound statistically oriented thinking is an important aspect of the solution of the optimisation of the burn-in process.

Klíčová slova

reliability, burn-in, technological, process, devices, experiment, screening

Autoři

NOVOTNÝ, R., BRADÍK, J.

Rok RIV

2002

Vydáno

6. 6. 2002

Nakladatel

Czech Technical University in Prague

Místo

Praha

ISBN

80-01-02547-0

Kniha

Experimental stress analysis

Strany od

185

Strany do

190

Strany počet

6

BibTex

@inproceedings{BUT5107,
  author="Radovan {Novotný} and Josef {Bradík}",
  title="Optimisation of the burn-in process",
  booktitle="Experimental stress analysis",
  year="2002",
  pages="6",
  publisher="Czech Technical University in Prague",
  address="Praha",
  isbn="80-01-02547-0"
}