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NOVOTNÝ, R., BRADÍK, J.
Originální název
Optimisation of the burn-in process
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The reliability of electronic devices constitutes an important aspect of quality control. Burn-in is an accelerated screening procedure that eliminates infant mortalities early on in the shop before shipping out the devices to the customers. Burn-in is screening premature failure at high temperature and high electrical loading. The design of experiments using sound statistically oriented thinking is an important aspect of the solution of the optimisation of the burn-in process.
Klíčová slova
reliability, burn-in, technological, process, devices, experiment, screening
Autoři
Rok RIV
2002
Vydáno
6. 6. 2002
Nakladatel
Czech Technical University in Prague
Místo
Praha
ISBN
80-01-02547-0
Kniha
Experimental stress analysis
Strany od
185
Strany do
190
Strany počet
6
BibTex
@inproceedings{BUT5107, author="Radovan {Novotný} and Josef {Bradík}", title="Optimisation of the burn-in process", booktitle="Experimental stress analysis", year="2002", pages="6", publisher="Czech Technical University in Prague", address="Praha", isbn="80-01-02547-0" }