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Detail publikace
ŠKARVADA, P. TOMÁNEK, P. GRMELA, L.
Originální název
Local measurement of solar cell emission characteristics
Typ
článek v časopise - ostatní, Jost
Jazyk
angličtina
Originální abstrakt
Light emission inspection technique are generally used for the localization of defects. In this paper, the emission comes from reverse biased mono-crystalline solar cells. Firstly, it is demonstrated that light emission of reverse biased solar cells is observable with our system. Experimental data of light emission from cracks, bulk defects, and borders of the cell are presented. Following these measurements, a few scratches were wittingly made on the top side of the solar cell sample and light emission was measured again for the same reverse voltage value. A method for distinguishing micro-crack and scratches from recombination centers is also presented. This method is based on detecting light emission intensity while varying the sample temperature, holding the reverse bias level fixed. The light emission data are then correlated with laser beam induced current maps. It is found that there is a different light emission temperature behavior in the case of bulk recombination defects and artificial damage defects. Finally, the scratched areas are inspected as sites of local structure damage.
Klíčová slova
solar cell, defect characterization, light emission
Autoři
ŠKARVADA, P.; TOMÁNEK, P.; GRMELA, L.
Rok RIV
2011
Vydáno
1. 11. 2011
Nakladatel
SPIE
Místo
USA
ISSN
0277-786X
Periodikum
Proceedings of SPIE
Ročník
8036
Číslo
8306
Stát
Spojené státy americké
Strany od
1H1
Strany do
1H6
Strany počet
6