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ŠKARVADA, P. TOMÁNEK, P. KOKTAVÝ, P.
Originální název
Microscale comparison of solar cell recombination centers
Typ
článek v časopise - ostatní, Jost
Jazyk
angličtina
Originální abstrakt
The aim of this work is an experimental microscale comparison of several imperfection types of silicon solar cells which emit visible light under reverse bias condition. The setup with scanning probe microscope (SPM) and sensitive detector is used for the measurement of light emission in microscale. Used SPM allows a measurement of Light Beam Induced Current (LBIC) with high spatial resolution together with sample topography. Due to a number of observed defects that have no correlation with surface topography, we have found out that there are also defects having strong correlation with surface topography. In the most cases, investigated inhomogeneites could not be localized via light induced beam technique.
Klíčová slova
solar cell, defects
Autoři
ŠKARVADA, P.; TOMÁNEK, P.; KOKTAVÝ, P.
Rok RIV
2011
Vydáno
27. 6. 2011
Nakladatel
ZČU
Místo
Plzeň
ISSN
1802-4564
Periodikum
ElectroScope - http://www.electroscope.zcu.cz
Ročník
Číslo
4
Stát
Česká republika
Strany od
25
Strany do
28
Strany počet
BibTex
@article{BUT75327, author="Pavel {Škarvada} and Pavel {Tománek} and Pavel {Koktavý}", title="Microscale comparison of solar cell recombination centers", journal="ElectroScope - http://www.electroscope.zcu.cz", year="2011", volume="2011", number="4", pages="25--28", issn="1802-4564" }