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MACKŮ, R.
Originální název
Analysis of photon emision from silicon solar cells and correlation with microplasma noise
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Camera has been used for mapping of surface photon emission in this study CCD. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Defects are often problem because of the increasing current density and the local temperature. In addition, degradation and/or irreversible destruction go hand in hand with this phenomenon. We managed to get information about localized bulk spots using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists in this paper. The results related to several defect spots are presented in detail in this paper.
Klíčová slova
solar cell, nondestructive testing, imperfections
Autoři
Rok RIV
2011
Vydáno
29. 4. 2011
Nakladatel
Novpress
Místo
Brno
ISBN
978-80-214-4273-3
Kniha
proceedings of the 17th conference student eeict 2011 vol. 3
Číslo edice
1
Strany od
417
Strany do
421
Strany počet
5
BibTex
@inproceedings{BUT75599, author="Robert {Macků}", title="Analysis of photon emision from silicon solar cells and correlation with microplasma noise", booktitle="proceedings of the 17th conference student eeict 2011 vol. 3", year="2011", number="1", pages="417--421", publisher="Novpress", address="Brno", isbn="978-80-214-4273-3" }