Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikace
NOVOTNÝ, R.
Originální název
Microelectronic structure reliability evaluation using response surface methodology
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The need for reliability assessment of designed or adjusted electronic devices at the development stage creates new requirements for realiability prediction and evaluation. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This article presents the response surface methodology as a statistical tool for creating maps of reliability performance for supposed device operating condition.
Klíčová slova v angličtině
reliability assessment, electronic devices, empirical approach
Autoři
Rok RIV
2003
Vydáno
1. 1. 2003
Nakladatel
Zdeněk Novotný
Místo
Brno
ISBN
8021424524
Kniha
10th Electronic Devices and Systems Conference 2003
Strany od
166
Strany do
169
Strany počet
4
BibTex
@inproceedings{BUT8375, author="Radovan {Novotný}", title="Microelectronic structure reliability evaluation using response surface methodology", booktitle="10th Electronic Devices and Systems Conference 2003", year="2003", pages="4", publisher="Zdeněk Novotný", address="Brno", isbn="8021424524" }