Detail publikace

Comparison of Methods of Piezoelectric Coefficient Measurement

FIALKA, J. BENEŠ, P.

Originální název

Comparison of Methods of Piezoelectric Coefficient Measurement

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper compares the main methods used for measuring of the piezoelectric material constants. It outlines the principle of three measuring methods most commonly used today, i.e. the frequency method, the laser interferometry method and the quasi-static method. These methods have been practically applied to piezoelectric ceramic samples. The paper describes the production of the piezoelectric ceramic samples of defined sizes in accordance with the current regulations. An NCE51 production code soft ceramic was used in the experiments. A piezoelectric charge coefficient was measured. The final values of the piezoelectric charge coefficient obtained through all the methods were compared to the catalogue values of the piezoelectric ceramic. All three methods can be described as appropriate; compared with the frequency method, the laser interferometry and quasi-static methods are rather time-consuming and more demanding with respect to preparation of the measurement experiment. The frequency method provides results within a smaller value range.

Klíčová slova

piezoelectric charge constant; frequency method; laser interferometry; quasi-static; PZT ceramics

Autoři

FIALKA, J.; BENEŠ, P.

Rok RIV

2012

Vydáno

13. 5. 2012

Nakladatel

IEEE Service Center

Místo

445 Hoes Lane Piscataway, NJ 08855-1331 USA

ISBN

978-1-4577-1771-0

Kniha

2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2012) Proceedings

Edice

1

Číslo edice

1

Strany od

37

Strany do

42

Strany počet

6

BibTex

@inproceedings{BUT92090,
  author="Jiří {Fialka} and Petr {Beneš}",
  title="Comparison of Methods of Piezoelectric Coefficient Measurement",
  booktitle="2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2012) Proceedings",
  year="2012",
  series="1",
  number="1",
  pages="37--42",
  publisher="IEEE Service Center",
  address="445 Hoes Lane
Piscataway, 
NJ 08855-1331 USA",
  isbn="978-1-4577-1771-0"
}