Detail publikace

An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick-Film Resistors

BELAVIC, D., ROCAK, D., SEDLÁKOVÁ, V., HROVAT, M., ŠIKULA, J., PAVELKA, J.

Originální název

An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick-Film Resistors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

In this paper we present an investigation of the long-term stability, the noise index (Quan-Tech Noise), and the nonlinearity iof small, thick-film resistors made with two high0ohmic (100 kOhm/sq. nominal sheet resistivity) thick-film resisotrs materials and terminated with two conductor materials (Ag/Pd and low-coist Ag). The results showed that the thick-film resistor paste 2051 has a better long-term stability and a lower current noise than the HS8049 resistor paste.

Klíčová slova v angličtině

thick-film resistor, long-term stability, noise index, nonlinearity

Autoři

BELAVIC, D., ROCAK, D., SEDLÁKOVÁ, V., HROVAT, M., ŠIKULA, J., PAVELKA, J.

Rok RIV

2003

Vydáno

1. 1. 2003

Nakladatel

CNRL

Místo

Brno

ISBN

80-238-9094-8

Kniha

Noise and Non-linearity Testing of Modern Electronic Components

Strany od

40

Strany do

43

Strany počet

4

BibTex

@inproceedings{BUT9252,
  author="Darko {Belavic} and Dubravka {Rocak} and Vlasta {Sedláková} and Marko {Hrovat} and Josef {Šikula} and Jan {Pavelka}",
  title="An Investigation of Noise, Nonlinearity, and Long-Term Stability of Thick-Film Resistors",
  booktitle="Noise and Non-linearity Testing of Modern Electronic Components",
  year="2003",
  pages="4",
  publisher="CNRL",
  address="Brno",
  isbn="80-238-9094-8"
}