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MIKEL, B., ČÍP, O.
Originální název
ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
High-precise industrial distance measurements by means of laser interferometer with a single-frequency He-Ne laser are used very often. Main disadvantage of that method is necessity to travel with a measuring retroreflector of Michelson interferometer across the measurement distance. On the other hand a narrow linewidth, frequency stability and beam shape of He-Ne laser lead to an ultra-high resolution below 1 nm [1]. In contrast to this conventional interferometry, the other one based on a tunable laser source allows to detect distances in a static way without moving the reflector. In this case, the moving process is replaced by tuning of the wavelength of laser source at front of Michelson interferometer. Then the synthetic wavelength, which is limited by a continuous tunable range of the laser, determines the scale resolution of the absolute distance interferometer.
Klíčová slova
Laser interferometry, semiconductor laser, temperature stability.
Autoři
Rok RIV
2003
Vydáno
10. 10. 2003
Nakladatel
Formatex
Místo
Španělsko
Strany od
979
Strany do
Strany počet
1
BibTex
@inproceedings{BUT9275, author="Břetislav {Mikel} and Ondřej {Číp}", title="ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER", booktitle="1st International Meeting on Applied Physics", year="2003", pages="1", publisher="Formatex", address="Španělsko" }