Detail publikace

ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER

MIKEL, B., ČÍP, O.

Originální název

ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

High-precise industrial distance measurements by means of laser interferometer with a single-frequency He-Ne laser are used very often. Main disadvantage of that method is necessity to travel with a measuring retroreflector of Michelson interferometer across the measurement distance. On the other hand a narrow linewidth, frequency stability and beam shape of He-Ne laser lead to an ultra-high resolution below 1 nm [1]. In contrast to this conventional interferometry, the other one based on a tunable laser source allows to detect distances in a static way without moving the reflector. In this case, the moving process is replaced by tuning of the wavelength of laser source at front of Michelson interferometer. Then the synthetic wavelength, which is limited by a continuous tunable range of the laser, determines the scale resolution of the absolute distance interferometer.

Klíčová slova

Laser interferometry, semiconductor laser, temperature stability.

Autoři

MIKEL, B., ČÍP, O.

Rok RIV

2003

Vydáno

10. 10. 2003

Nakladatel

Formatex

Místo

Španělsko

Strany od

979

Strany do

979

Strany počet

1

BibTex

@inproceedings{BUT9275,
  author="Břetislav {Mikel} and Ondřej {Číp}",
  title="ABSOLUTE DISTANCE MEASUREMENTS WITH TUNABLE SEMICONDUCTOR LASER",
  booktitle="1st International Meeting on Applied Physics",
  year="2003",
  pages="1",
  publisher="Formatex",
  address="Španělsko"
}