Detail publikace

Investigation of solar cell performance studied by local breakdowns and related noise

MACKŮ, R. KOKTAVÝ, P. ŠICNER, J.

Originální název

Investigation of solar cell performance studied by local breakdowns and related noise

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper will be dealt with the use of the electrical noise and the specific pn junction breakdowns for solar cells diagnostic purposes. Diffusion technology based pn junctions of the silicon solar cells have been investigated by measurement of electrical noise, transport characteristics and radiation of defect regions in the visible and deep infrared range. Due to the large surface to volume ratio solar cells contain lots of defects that determine the properties of the whole solar cells and introduce loss parameters. Our paper analyses in detail the issue of measuring the electrical noise and fluctuation activity correlated with the optical activity under reverse-biased conditions. Special affords in our research were devoted to finding relations between the specimen IV curves and the noise generated in consequence of the local but also semi-local defects in the solar cell structure.

Klíčová slova

Solar cell, defect, electrical noise, photon emission

Autoři

MACKŮ, R.; KOKTAVÝ, P.; ŠICNER, J.

Rok RIV

2012

Vydáno

28. 6. 2012

Nakladatel

VUT v Brně

Místo

Brno

ISBN

978-80-214-4539-0

Kniha

Electronic Devices ans Systems 2012

Edice

1

Číslo edice

1

Strany od

267

Strany do

272

Strany počet

6

BibTex

@inproceedings{BUT92923,
  author="Robert {Macků} and Pavel {Koktavý} and Jiří {Šicner}",
  title="Investigation of solar cell performance studied by local breakdowns and related noise",
  booktitle="Electronic Devices ans Systems 2012",
  year="2012",
  series="1",
  number="1",
  pages="267--272",
  publisher="VUT v Brně",
  address="Brno",
  isbn="978-80-214-4539-0"
}