Detail publikace

Identification of Micro-scale Defects in Crystalline Solar Cell Structure

ŠICNER, J. KOKTAVÝ, P. DALLAEVA, D.

Originální název

Identification of Micro-scale Defects in Crystalline Solar Cell Structure

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity. We also focused on thermal degradation in stressed regions. To this aim we used an infrared camera and it turns out that temperature degradation could occur in large scale region compare to micro-scale defects.

Klíčová slova

Solar cell, local defect, fractured surface, nondestructive testing.

Autoři

ŠICNER, J.; KOKTAVÝ, P.; DALLAEVA, D.

Rok RIV

2012

Vydáno

26. 8. 2012

Místo

Kazaň

ISBN

978-5-905576-18-8

Kniha

Fracture Mechanics for Durability, Reliability and Safety

Strany od

532

Strany do

539

Strany počet

8

BibTex

@inproceedings{BUT96043,
  author="Jiří {Šicner} and Pavel {Koktavý} and Dinara {Sobola}",
  title="Identification of Micro-scale Defects in Crystalline Solar Cell Structure",
  booktitle="Fracture Mechanics for Durability, Reliability and Safety",
  year="2012",
  pages="532--539",
  address="Kazaň",
  isbn="978-5-905576-18-8"
}