Detail publikace

Solar Cell Structure Defects and Cracks

ŠKARVADA, P. TOMÁNEK, P. DALLAEVA, D.

Originální název

Solar Cell Structure Defects and Cracks

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Photon emission from the reverse biased silicon solar cell samples was used for localization of defects. Light was detected in the wavelength range 350-800 nm. Laser beam induced current technique was used for crack localization and results were correlated with light emission. Defects that emit photons with mechanism different to avalanche breakdown were investigated in microscale using scanning electron microscopy. In the most of the defective areas structure damages uncovering the pn junction have been found.

Klíčová slova

silicon solar cell, bulk defects, edge defects, scanning probe microscopy, laser beam induced current

Autoři

ŠKARVADA, P.; TOMÁNEK, P.; DALLAEVA, D.

Rok RIV

2012

Vydáno

26. 8. 2012

Místo

Kazaň

ISBN

978-5-905576-18-8

Kniha

Fracture Mechanics for Durability, Reliability and Safety

Strany od

507

Strany do

514

Strany počet

8

BibTex

@inproceedings{BUT96065,
  author="Pavel {Škarvada} and Pavel {Tománek} and Dinara {Sobola}",
  title="Solar Cell Structure Defects and Cracks",
  booktitle="Fracture Mechanics for Durability, Reliability and Safety",
  year="2012",
  pages="507--514",
  address="Kazaň",
  isbn="978-5-905576-18-8"
}