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Detail publikace
ŠKARVADA, P. TOMÁNEK, P. DALLAEVA, D.
Originální název
Solar Cell Structure Defects and Cracks
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Photon emission from the reverse biased silicon solar cell samples was used for localization of defects. Light was detected in the wavelength range 350-800 nm. Laser beam induced current technique was used for crack localization and results were correlated with light emission. Defects that emit photons with mechanism different to avalanche breakdown were investigated in microscale using scanning electron microscopy. In the most of the defective areas structure damages uncovering the pn junction have been found.
Klíčová slova
silicon solar cell, bulk defects, edge defects, scanning probe microscopy, laser beam induced current
Autoři
ŠKARVADA, P.; TOMÁNEK, P.; DALLAEVA, D.
Rok RIV
2012
Vydáno
26. 8. 2012
Místo
Kazaň
ISBN
978-5-905576-18-8
Kniha
Fracture Mechanics for Durability, Reliability and Safety
Strany od
507
Strany do
514
Strany počet
8
BibTex
@inproceedings{BUT96065, author="Pavel {Škarvada} and Pavel {Tománek} and Dinara {Sobola}", title="Solar Cell Structure Defects and Cracks", booktitle="Fracture Mechanics for Durability, Reliability and Safety", year="2012", pages="507--514", address="Kazaň", isbn="978-5-905576-18-8" }