Detail publikace

Charge Carriers Transport and Noise of Niobium Capacitors

ŠIKULA, J., PAVELKA, J., GRMELA, L., DOBIS, P., ZEDNÍČEK, T.

Originální název

Charge Carriers Transport and Noise of Niobium Capacitors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

A charge carriers transport mechanism and low frequency noise analysis has been performed on niobium capacitors to determine the mechanism of current flow and current noise sources, both in normal and reverse directions. The model of this MIS structure can be used to give a physical interpretation of the niobium capacitor characteristics and temperature dependences. In normal mode the V.A. characteristic can be approximated by Poole-Frenkel emission. In reverse mode two regions can be distinguished with respect to applied voltage. For applied voltage less than 0.5 V the V.A. characteristic can be approximated by exponential dependence of current on applied voltage. The noise spectral density varies approximately with the square of the leakage current, but it was frequently observed that the noise spectral density is related to the “excess” component of the leakage current. This excess current is most likely to be localised in discrete regions, flaws or defects. The temperature dependence of leakage current is also of an exponential form. The noise spectral density is 1/f in normal operation mode. Noise and transport characteristics are similar to that of tantalum capacitors.

Klíčová slova

Charge carriers transport, leakage current, noise, niobium capacitors

Autoři

ŠIKULA, J., PAVELKA, J., GRMELA, L., DOBIS, P., ZEDNÍČEK, T.

Rok RIV

2002

Vydáno

20. 10. 2002

Nakladatel

Electronic Components Institute Internationale Ltd.

Místo

Swindon, England

Strany od

32

Strany do

36

Strany počet

5

BibTex

@inproceedings{BUT9624,
  author="Josef {Šikula} and Jan {Pavelka} and Lubomír {Grmela} and Pavel {Dobis} and Tomáš {Zedníček}",
  title="Charge Carriers Transport and Noise of Niobium Capacitors",
  booktitle="CARTS-EUROPE 2002 Proceedings, 16th European Passive Components Conference",
  year="2002",
  number="1.",
  pages="5",
  publisher="Electronic Components Institute Internationale Ltd.",
  address="Swindon, England"
}