Detail publikace

Reduction of Test Vectors Number based on Parasitic Capacity Extraction of Scan Chain Wires

BARTOŠ, P. KOTÁSEK, Z.

Originální název

Reduction of Test Vectors Number based on Parasitic Capacity Extraction of Scan Chain Wires

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

In this paper, method for scan chain optimisation performed after physical layout is presented. It is shown how the method can be used to decrease the number of test vectors. The principles of the method are based on parasitic capacity extraction, eliminating some bridging faults in the physical layout and subsequent reduction of the number of test vectors needed to test the circuit. The method was verified on circuits from benchmark set, experimental results are provided and discussed. It is expected that the method can be used in mass production of electronic components.

Klíčová slova

scan chain, reorganization, reordering, test, vector, bridge

Autoři

BARTOŠ, P.; KOTÁSEK, Z.

Rok RIV

2012

Vydáno

3. 10. 2012

Nakladatel

Faculty of Electrical Engineering and Informatics, University of Technology Košice

Místo

Košice

ISBN

978-80-8143-049-7

Kniha

Proceedings of CSE 2012 International Scientific Conference on Computer Science and Engineering

Strany od

162

Strany do

169

Strany počet

8

URL

https://www.fit.vut.cz/research/publication/10033/

BibTex

@inproceedings{BUT96976,
  author="Pavel {Bartoš} and Zdeněk {Kotásek}",
  title="Reduction of Test Vectors Number based on Parasitic Capacity Extraction of Scan Chain Wires",
  booktitle="Proceedings of CSE 2012 International Scientific Conference on Computer Science and Engineering",
  year="2012",
  pages="162--169",
  publisher="Faculty of Electrical Engineering and Informatics, University of Technology Košice",
  address="Košice",
  isbn="978-80-8143-049-7",
  url="https://www.fit.vut.cz/research/publication/10033/"
}