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TRUHLÁŘ, M. KRUML, T. KUBĚNA, I. PETRÁČKOVÁ, K. NÁHLÍK, L.
Originální název
Determination of mechanical properties from microcompression test
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
This paper describes a microcompression test of Al - 1.5 wt. % Cu thin film deposited on Si substrate. Microcompression combines the sample preparation with the use of ion focused beam (FIB) with a compression test carried out using nanoindenter. Cylindrical specimens (pillars) were prepared using FIB. The diameter of pillars was about 1.3 microns and their height was about 2 microns (equal to the film thickness). Stress-strain curves of the thin film were obtained. The results depend on crystallographic orientation of pillar. The paper is focused to an attempt to determine as precisely as possible Young modulus of the film using experimental data and finite element modelling.
Klíčová slova
mechanical properties, thin layers, microcompression test
Autoři
TRUHLÁŘ, M.; KRUML, T.; KUBĚNA, I.; PETRÁČKOVÁ, K.; NÁHLÍK, L.
Rok RIV
2012
Vydáno
14. 5. 2012
ISBN
978-80-86246-40-6
Kniha
Sborník Engineering Mechanics 2012
Strany od
1435
Strany do
1440
Strany počet
6
BibTex
@inproceedings{BUT97155, author="Michal {Truhlář} and Tomáš {Kruml} and Ivo {Kuběna} and Klára {Petráčková} and Luboš {Náhlík}", title="Determination of mechanical properties from microcompression test", booktitle="Sborník Engineering Mechanics 2012", year="2012", pages="1435--1440", isbn="978-80-86246-40-6" }