Detail publikace

Generation Of Shock Waves In Environmental Scanning Electron Microscope And Their Description

VYROUBAL, P.

Originální název

Generation Of Shock Waves In Environmental Scanning Electron Microscope And Their Description

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods. In this microscope, we can observe various types of specimens, es-pecially non-conductive and wet specimens. This is given by high pressure of gas in the specimen chamber. This article deals with computational modelling of pressure conditions and shock waves generation in the scintillation detector of secondary electrons for this type of micro-scope.

Klíčová slova

Scintillation detector of secondary electrons, finite element method, upwind computational scheme, shock wave.

Autoři

VYROUBAL, P.

Rok RIV

2013

Vydáno

26. 4. 2013

Nakladatel

LITERA

Místo

Brno

ISBN

978-80-214-4695-3

Kniha

Student EEICT Proceedings of the 19th conference

Číslo edice

1

Strany od

189

Strany do

193

Strany počet

5

BibTex

@inproceedings{BUT99403,
  author="Petr {Vyroubal}",
  title="Generation Of Shock Waves In Environmental Scanning Electron Microscope And Their Description",
  booktitle="Student EEICT Proceedings of the 19th conference",
  year="2013",
  number="1",
  pages="189--193",
  publisher="LITERA",
  address="Brno",
  isbn="978-80-214-4695-3"
}