Publications

• 2024

  ALLAHAM, M.; DALLAEV, R.; BURDA, D.; SOBOLA, D.; NEBOJSA, A.; KNÁPEK, A.; MOUSA, M.; KOLAŘÍK, V. Energy gap measurements based on enhanced absorption coefficient calculation from transmittance and reflectance raw data. PHYSICA SCRIPTA, 2024, vol. 99, no. 1, p. 1-9. ISSN: 1402-4896.
  Detail | WWW | Full text in the Digital Library

• 2022

  DREXLER, P.; NEŠPOR, D.; KADLEC, R.; KŘÍŽ, T.; NEBOJSA, A. Simulation and Characterization of Nanostructured Electromagnetic Scatterers for Information Encoding. Electronics (MDPI), 2022, vol. 11, no. 20, p. 1-12. ISSN: 2079-9292.
  Detail | WWW | Full text in the Digital Library

• 2021

  SEDLÁK, P.; SOBOLA, D.; GAJDOŠ, A.; DALLAEV, R.; NEBOJSA, A.; KUBERSKÝ, P. Surface Analyses of PVDF/NMP/[EMIM][TFSI] Solid Polymer Electrolyte. Polymers, 2021, vol. 13, no. 16, p. 1-16. ISSN: 2073-4360.
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  PAPEŽ, N.; DALLAEV, R.; KASPAR, P.; SOBOLA, D.; ŠKARVADA, P.; ŢĂLU, Ş.; RAMAZANOV, S.; NEBOJSA, A. Characterization of GaAs Solar Cells under Supercontinuum Long-Time Illumination. Materials, 2021, vol. 14, no. 2, p. 1-13. ISSN: 1996-1944.
  Detail | WWW | Full text in the Digital Library

• 2020

  PAPEŽ, N.; GAJDOŠ, A.; DALLAEV, R.; SOBOLA, D.; SEDLÁK, P.; MOTÚZ, R.; NEBOJSA, A.; GRMELA, L. Performance analysis of GaAs based solar cells under gamma irradiation. Applied Surface Science, 2020, no. 510, p. 265-272. ISSN: 0169-4332.
  Detail | WWW

• 2019

  SOBOLA, D.; KASPAR, P.; NEBOJSA, A.; HEMZAL, D.; GRMELA, L.; SMITH, S. Characterization of the native oxide on CdTe surfaces. MATERIALS SCIENCE-POLAND, 2019, vol. 37, no. 2, p. 206-211. ISSN: 2083-134X.
  Detail | WWW | Full text in the Digital Library

  KASPAR, P.; SOBOLA, D.; DALLAEV, R.; RAMAZANOV, S.; NEBOJSA, A.; REZAEE, S.; GRMELA, L. Characterization of Fe2O3 thin film on highly oriented pyrolytic graphite by AFM, Ellipsometry and XPS. Applied Surface Science, 2019, vol. 493, no. 1, p. 673-678. ISSN: 0169-4332.
  Detail | WWW

• 2018

  PAPEŽ, N.; SOBOLA, D.; GAJDOŠ, A.; ŠKVARENINA, Ľ.; MACKŮ, R.; ELIÁŠ, M.; NEBOJSA, A.; MOTÚZ, R. Surface morphology after reactive ion etching of silicon and gallium arsenide based solar cells. Journal of Physics: Conference Series, 2018, vol. 1124, no. 4, p. 165-171. ISSN: 1742-6596.
  Detail | WWW

• 2005

  BONAVENTUROVÁ - ZRZAVECKÁ, O.; BRANDEJSOVÁ, E.; ČECHAL, J.; POTOČEK, M.; NEBOJSA, A.; NAVRÁTIL, K.; ŠIKOLA, T.; HUMLÍČEK, J. UV in-situ degradation of PMPSi analysed by spectroscopic ellipsometry, XPS and TDS. 1. Vienna: 2005. p. 294-294.
  Detail

• 2004

  ČECHAL, J.; TICHOPÁDEK, P.; NEBOJSA, A.; BONAVENTUROVÁ, O.; URBÁNEK, M.; SPOUSTA, J.; NAVRÁTIL, K.; ŠIKOLA, T. In situ analysis of PMPSi by spectroscopic ellipsometry and XPS. Surface and Interface Analysis, 2004, vol. 38, no. 8, p. 1218 ( p.)ISSN: 0142- 2421.
  Detail

  BRANDEJSOVÁ, E.; ČECHAL, J.; BONAVENTUROVÁ, O.; NEBOJSA, A.; TICHOPÁDEK, P.; URBÁNEK, M.; NAVRÁTIL, K.; ŠIKOLA, T.; HUMLÍČEK, J. In situ analysis of PMPSi thin films by spectroscopic ellipsometry. Jemná mechanika a optika, 2004, vol. 9, no. 9, p. 260 ( p.)ISSN: 0447- 6441.
  Detail

• 2002

  TICHOPÁDEK, P., ŠIKOLA, T., NEBOJSA, A., NAVRÁTIL, K., ČECHAL, J., JURKOVIČ, P., BÁBOR, P. A Study of Thin Oxide Films by Ellipsometry and AR XPS. Surface and Interface Analysis, 2002, vol. 34, no. 1, p. 531 ( p.)ISSN: 0142- 2421.
  Detail

  SPOUSTA, J., ŠIKOLA, T., ZLÁMAL, J., URBÁNEK, M., NAVRÁTIL, K., JIRUŠE, J., CHMELÍK, R., NEBOJSA, A. In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films. Surface and Interface Analysis, 2002, vol. 34, no. 1, p. 664 ( p.)ISSN: 0142- 2421.
  Detail

• 2001

  SPOUSTA, J., URBÁNEK, M., ŠIKOLA, T., NEBOJSA, A., CHMELÍK, R., ZLÁMAL, J., JIRUŠE, J. In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films. In 9th European Conference on Applications of Surface and Interface Analysis (ECASIA'01) Book of Abstracts. Avignon, France: P. Marcus, A. Galtayries, N. Frémy, 2001. p. 295 ( p.)
  Detail

  TICHOPÁDEK, P.; ŠIKOLA, T.; NEBOJSA, A.; ČECHAL, J. Application of Spectroscopic Ellipsometry in Ultrathin Film Analysis. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: FEI VUT v Brně, 2001. p. 415 ( p.)ISBN: 80-214-1992- X.
  Detail

  TICHOPÁDEK, P., ŠIKOLA, T., NEBOJSA, A., NAVRÁTIL, K., JURKOVIČ, P., ČECHAL, J. A Study of Thin Oxide Films by Ellipsometry and AR XPS. In 9th European Conference on Applications of Surface and Interface Analysis (ECASIA'01) Book of Abstracts. Avignon, France: P. Marcus, A. Galtayries, N. Frémy, 2001. p. 360 ( p.)
  Detail

  TICHOPÁDEK, P., NEBOJSA, A., ČECHAL, J. Konstrukce elipsometru pro měření tenkých vrstev a povrchů. Jemná mechanika a optika, 2001, vol. 46, no. 4, p. 136 ( p.)ISSN: 0447- 6441.
  Detail

  TICHOPÁDEK, P., NEBOJSA, A., ČECHAL, J. Ellipsometry - a tool for surface and thin film analysis. In Juniormat ' 01 sborník. Brno: Fakulta strojního inženýrství VUT v Brně, 2001. p. 102 ( p.)
  Detail

• 2000

  ŠIKOLA, T., NEBOJSA, A., SPOUSTA, J., DITTRICHOVÁ, L., LOPOUR, F., ZLÁMAL, J., TICHOPÁDEK, P., KRÁL, J., RAFAJA, D., RANNO, L. Deposition of Thin Films/ Multilayers by IBAD. In procedings of conference Metal 2000. Ostrava: VŠB Ostrava, 2000. p. 81 ( p.)
  Detail

  TENGEL, M., NEBOJSA, A. Termochemická analýza jakosti povrchu regenerovaných ostřiv. In II. sborník příspěvků doktorandů, konference u příležitosti 100. výročí založení FSI. Brno: Vutium, 2000. p. 325 ( p.)
  Detail

  URBÁNEK, M., ŠIKOLA, T., NEBOJSA, A., SPOUSTA, J., DITTRICHOVÁ, L., CHMELÍK, R., ZLÁMAL, J., JIRUŠE, J. Monitoring of surface homogeneity of optical parameters of thin films. In Micromat 2000. Berlin: Editors: B. Michel, T. Winkler, M. Werner,H. Fecht, 2000. p. 604 ( p.)
  Detail

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