Ing.
Michal Potoček
Ph.D.
FME, IPE – Assistant professor
+420 54114 2783
potocek@fme.vutbr.cz
Publications
2023
SALAMON, D.; BUKVIŠOVÁ, K.; JAN, V.; POTOČEK, M.; ČECHAL, J. Superflux of an organic adlayer towards its local reactive immobilization. Communications Chemistry, 2023, vol. 6, no. 1, ISSN: 2399-3669.
Detail | WWW | Full text in the Digital Library2021
MACKOVÁ, A.; FERNANDES, S.; MATĚJÍČEK, J.; VILÉMOVÁ, M.; HOLÝ, V.; LIEDKE, M.O.; MARTAN, J.; VRONKA, M.; POTOČEK, M.; BÁBOR, P.; BUTTERLING, M.; ATTALLAH, A.G.; HIRSCHMANN, E.; WAGNER, A.; HAVRANEK, V. Radiation damage evolution in pure W and W-Cr-Hf alloy caused by 5 MeV Au ions in a broad range of dpa. Nuclear Materials and Energy, 2021, vol. 29, no. 1,
p. 101085-1 (101085-15 p.) ISSN: 2352-1791.
Detail | WWW2020
UHLÍŘ, V.; PRESSACCO, F.; ARREGI URIBEETXEBARRIA, J.; PROCHÁZKA, P.; PRŮŠA, S.; POTOČEK, M.; ŠIKOLA, T.; ČECHAL, J.; BENDOUNAN, A.; SIROTTI, F. Single-layer graphene on epitaxial FeRh thin films. Applied Surface Science, 2020, vol. 514, no. 1,
p. 145923-1 (145923-7 p.) ISSN: 0169-4332.
Detail | WWW | Full text in the Digital LibrarySOBOLA, D.; RAMAZANOV, S.; KONEČNÝ, M.; ORUDZHEV, F.; KASPAR, P.; PAPEŽ, N.; KNÁPEK, A.; POTOČEK, M. Complementary SEM-AFM of Swelling Bi-Fe-O Film on HOPG Substrate. Materials, 2020, vol. 13, no. 1,
p. 1-15. ISSN: 1996-1944.
Detail | WWW | Full text in the Digital LibraryRAMAZANOV, S.; SOBOLA, D.; ORUDZHEV, F.; KNÁPEK, A.; POLČÁK, J.; POTOČEK, M.; KASPAR, P.; DALLAEV, R. Surface Modification and Enhancement of Ferromagnetism in BiFeO3 Nanofilms Deposited on HOPG. Nanomaterials, 2020, vol. 10, no. 10,
p. 1990-1 (1990-17 p.) ISSN: 2079-4991.
Detail | WWW | Full text in the Digital LibraryŠETKA, M.; BAHOS, F.; MATATAGUI, D.; POTOČEK, M.; KRÁL, Z.; DRBOHLAVOVÁ, J.; GRÁCIA, I.; VALLEJOS VARGAS, S. Love wave sensors based on gold nanoparticle-modified polypyrrole and their properties to ammonia and ethylene. Sensors and Actuators B: Chemical, 2020, vol. 8, no. 1,
p. 1-10. ISSN: 0925-4005.
Detail | WWW | Full text in the Digital Library2019
HOLEŇÁK, R.; SPUSTA, T.; POTOČEK, M.; SALAMON, D.; ŠIKOLA, T.; BÁBOR, P. 3D localization of spinel (MgAl2O4) and sodium contamination in alumina by TOF-SIMS. MATERIALS CHARACTERIZATION, 2019, vol. 148, no. 1,
p. 252-258. ISSN: 1044-5803.
Detail | WWW2016
BÁBOR, P.; POTOČEK, M.; ŠIKOLA, T. Příprava vzorků pro testování rozlišení. Brno: 2016.
p. 1-14.
DetailŠIK, O.; BÁBOR, P.; ŠKARVADA, P.; POTOČEK, M.; TRČKA, T.; GRMELA, L.; BELAS, E. Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties. Surface and Coatings Technology, 2016, vol. 306, no. A,
p. 75-81. ISSN: 0257-8972.
Detail | WWW2015
BÁBOR, P.; DUDA, R.; POLČÁK, J.; PRŮŠA, S.; POTOČEK, M.; VARGA, P.; ČECHAL, J.; ŠIKOLA, T. Real-time observation of self-limiting SiO2/Si decomposition catalysed by gold silicide droplets. RSC Advances, 2015, vol. 5, no. 123,
p. 101726-101731. ISSN: 2046-2069.
Detail2009
POTOČEK, M.; BÁBOR, P.; ŠIKOLA, T. Využití termální desorpční spektroskopie při studiu povrchové kontaminace. Jemná mechanika a optika, 2009, vol. 54, no. 7- 8,
p. 217-218. ISSN: 0447- 6441.
Detail2008
MACH, J.; ČECHAL, J.; KOLÍBAL, M.; POTOČEK, M.; ŠIKOLA, T. Atomic hydrogen induced gallium nanocluster formation on the Si(100) surface. Surface Science, 2008, vol. 602, no. 10,
p. 1898-1902. ISSN: 0039- 6028.
Detail2006
KOLÍBAL, M.; PRŮŠA, S.; PLOJHAR, M.; BÁBOR, P.; POTOČEK, M.; TOMANEC, O.; KOSTELNÍK, P.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. In situ Analysis of Ga-ultra Thin Films by ToF- LEIS. Nuclear Instruments and Methods in Physics Research B, 2006, vol. 249, no. 1- 2,
p. 318-321. ISSN: 0168- 583X.
Detail2005
KOLÍBAL, M.; PRŮŠA, S.; PLOJHAR, M.; BÁBOR, P.; POTOČEK, M.; TOMANEC, O.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. In situ Analysis of Ga-ultra Thin Films by TOF- LEIS. 1. Seville: 2005.
DetailKOLÍBAL, M.; PRŮŠA, S.; TOMANEC, O.; POTOČEK, M.; ČECHAL, J.; KOSTELNÍK, P.; PLOJHAR, M.; BÁBOR, P.; SPOUSTA, J.; MARKIN, S.; BAUER, P.; ŠIKOLA, T. Application of ToF LEIS for Monitoring the growth and thermal treatment of Ga ultrathin films. 1. Vienna: 2005.
p. 191-191.
DetailBÁBOR, P.; POTOČEK, M.; URBÁNEK, M.; MACH, J.; SPOUSTA, J.; DITTRICHOVÁ, L.; SOBOTA, J.; BOCHNÍČEK, Z.; ŠIKOLA, T. Depth Profiling of Ultrathin Films and Their Multilayers by DSIMS. 1. Seville: 2005.
DetailBÁBOR, P.; POTOČEK, M.; URBÁNEK, M.; MACH, J.; SPOUSTA, J.; DITTRICHOVÁ, L.; SOBOTA, J.; BOCHNÍČEK, Z.; ŠIKOLA, T. Depth Profiling of Ultrathin Films and Their Multilayers by DSIMS. 1. Manchester: 2005.
p. 178-178.
DetailBONAVENTUROVÁ - ZRZAVECKÁ, O.; BRANDEJSOVÁ, E.; ČECHAL, J.; POTOČEK, M.; NEBOJSA, A.; NAVRÁTIL, K.; ŠIKOLA, T.; HUMLÍČEK, J. UV in-situ degradation of PMPSi analysed by spectroscopic ellipsometry, XPS and TDS. 1. Vienna: 2005.
p. 294-294.
DetailVOBORNÝ, S.; MACH, J.; POTOČEK, M.; KOSTELNÍK, P.; ČECHAL, J.; BÁBOR, P.; SPOUSTA, J.; ŠIKOLA, T. Analysis of GaN Ultrathin Films grown by Direct Ion Beam Deposition. 1. Vienna: 2005.
p. 117-117.
Detail2004
VOBORNÝ, S., MACH, J., KOLÍBAL, M., ČECHAL, J., BÁBOR, P., POTOČEK, M., ŠIKOLA, T. A study of Early Periods of GaN Ultrathin Film Growth. In New Trends in Pysics. Brno: VUT v Brně, 2004.
p. 270 ( p.) ISBN: 80-7355-024- 5.
Detail
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