Dual-Target X-ray nano Computed tomography is a technique where two energy and material separate X-ray spectra are utilised for precise examination and separation of individual sample components such as materials or tissues. However, for optimal data-processing of such acquired data, strict conditions regarding data alignment need to be fulfilled, which is in practice hardly achievable. Therefore proposed project is focused on the development of optimal data alignment procedure for high-resolution Dual-Target X-ray Computed tomography data.

CEITEC VUT-J-19-5958

Czech

Šalplachta Jakub, Ing. - principal person responsible
Kaiser Jozef, prof. Ing., Ph.D. - fellow researcher

Central European Institute of Technology BUT
- responsible department (15.1.2020 - not assigned)
Central European Institute of Technology BUT
- beneficiary (1.1.2019 - 31.12.2019)

Responsibility: Šalplachta Jakub, Ing.