Dual-Target X-ray nano Computed tomography is a technique where two energy and material separate X-ray spectra are utilised for precise examination and separation of individual sample components such as materials or tissues. However, for optimal data-processing of such acquired data, strict conditions regarding data alignment need to be fulfilled, which is in practice hardly achievable. Therefore proposed project is focused on the development of optimal data alignment procedure for high-resolution Dual-Target X-ray Computed tomography data.

CEITEC VUT-J-19-5958

čeština

Šalplachta Jakub, Ing. - hlavní řešitel
Kaiser Jozef, prof. Ing., Ph.D. - spoluřešitel

Středoevropský technologický institut VUT
- odpovědné pracoviště (15.1.2020 - nezadáno)
Středoevropský technologický institut VUT
- příjemce (1.1.2019 - 31.12.2019)

Odpovědnost: Šalplachta Jakub, Ing.