Publication detail

Normalized Testability Measures at RT Level: Utilization and Reasons for Creation

STRNADEL, J. KOTÁSEK, Z.

Original Title

Normalized Testability Measures at RT Level: Utilization and Reasons for Creation

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.

Keywords

Register-transfer level, controllability, observability, testability, testability analysis

Authors

STRNADEL, J.; KOTÁSEK, Z.

RIV year

2002

Released

29. 4. 2002

Location

Ostrava

ISBN

80-85988-71-2

Book

Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems

Edition

Vol. I.

Pages from

297

Pages to

304

Pages count

8

URL

https://www.fit.vut.cz/research/publication/6917/

BibTex

@inproceedings{BUT10010,
  author="Josef {Strnadel} and Zdeněk {Kotásek}",
  title="Normalized Testability Measures at RT Level: Utilization and Reasons for Creation",
  booktitle="Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems",
  year="2002",
  series="Vol. I.",
  pages="297--304",
  address="Ostrava",
  isbn="80-85988-71-2",
  url="https://www.fit.vut.cz/research/publication/6917/"
}

Documents

2002-mosis.pdf