Detail publikace

Normalized Testability Measures at RT Level: Utilization and Reasons for Creation

STRNADEL, J. KOTÁSEK, Z.

Originální název

Normalized Testability Measures at RT Level: Utilization and Reasons for Creation

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.

Klíčová slova

Register-transfer level, controllability, observability, testability, testability analysis

Autoři

STRNADEL, J.; KOTÁSEK, Z.

Rok RIV

2002

Vydáno

29. 4. 2002

Místo

Ostrava

ISBN

80-85988-71-2

Kniha

Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems

Edice

Vol. I.

Strany od

297

Strany do

304

Strany počet

8

URL

https://www.fit.vut.cz/research/publication/6917/

BibTex

@inproceedings{BUT10010,
  author="Josef {Strnadel} and Zdeněk {Kotásek}",
  title="Normalized Testability Measures at RT Level: Utilization and Reasons for Creation",
  booktitle="Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems",
  year="2002",
  series="Vol. I.",
  pages="297--304",
  address="Ostrava",
  isbn="80-85988-71-2",
  url="https://www.fit.vut.cz/research/publication/6917/"
}

Dokumenty

2002-mosis.pdf