Publication detail

Beyond Imaging: Scanning Electron Microscope for the Quantitative Mass Measurement

KRZYŽÁNEK, V. TACKE, S. DOBRANSKÁ, K. REICHELT, R.

Original Title

Beyond Imaging: Scanning Electron Microscope for the Quantitative Mass Measurement

Type

journal article - other

Language

English

Original Abstract

Scanning electron microscope is used for quantitative mass measurement of macromolecules. This is a unique method - STEM, which can image the samples and measure their weight in addition.

Keywords

STEM, ADF, mass measurement

Authors

KRZYŽÁNEK, V.; TACKE, S.; DOBRANSKÁ, K.; REICHELT, R.

RIV year

2013

Released

10. 8. 2013

ISBN

1431-9276

Periodical

MICROSCOPY AND MICROANALYSIS

Year of study

19

Number

S2

State

United States of America

Pages from

130

Pages to

131

Pages count

2

BibTex

@article{BUT101367,
  author="KRZYŽÁNEK, V. and TACKE, S. and DOBRANSKÁ, K. and REICHELT, R.",
  title="Beyond Imaging: Scanning Electron Microscope for the Quantitative Mass Measurement",
  journal="MICROSCOPY AND MICROANALYSIS",
  year="2013",
  volume="19",
  number="S2",
  pages="130--131",
  issn="1431-9276"
}