Publication detail
Beyond Imaging: Scanning Electron Microscope for the Quantitative Mass Measurement
KRZYŽÁNEK, V. TACKE, S. DOBRANSKÁ, K. REICHELT, R.
Original Title
Beyond Imaging: Scanning Electron Microscope for the Quantitative Mass Measurement
Type
journal article - other
Language
English
Original Abstract
Scanning electron microscope is used for quantitative mass measurement of macromolecules. This is a unique method - STEM, which can image the samples and measure their weight in addition.
Keywords
STEM, ADF, mass measurement
Authors
KRZYŽÁNEK, V.; TACKE, S.; DOBRANSKÁ, K.; REICHELT, R.
RIV year
2013
Released
10. 8. 2013
ISBN
1431-9276
Periodical
MICROSCOPY AND MICROANALYSIS
Year of study
19
Number
S2
State
United States of America
Pages from
130
Pages to
131
Pages count
2
BibTex
@article{BUT101367,
author="KRZYŽÁNEK, V. and TACKE, S. and DOBRANSKÁ, K. and REICHELT, R.",
title="Beyond Imaging: Scanning Electron Microscope for the Quantitative Mass Measurement",
journal="MICROSCOPY AND MICROANALYSIS",
year="2013",
volume="19",
number="S2",
pages="130--131",
issn="1431-9276"
}