Přístupnostní navigace
E-application
Search Search Close
Publication detail
STRNADEL, J. KOTÁSEK, Z.
Original Title
Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level
Type
article in a collection out of WoS and Scopus
Language
English
Original Abstract
In the paper a new heuristic approach to the RTL testability analysis is presented. It is shown how the values of controllability/observability factors reflecting the structure of the circuit and other factors can be utilised to find solutions which are sub-optimal but still acceptable for the designer. The goal of the methodology is to enable the identification of such testability solutions which satisfy concrete requirements in terms of the number of registers included into the scan chain, the area overhead and the test application time as a result of RTL testability analysis. The approach is based on the combination of analytical and evolutionary approaches at the RT level.
Keywords
design for testability, scan technique, scan register, scan chain, state-space analysis, evolutionary approach, genetic algorithm
Authors
STRNADEL, J.; KOTÁSEK, Z.
RIV year
2002
Released
1. 9. 2002
Publisher
IEEE Computer Society Press
Location
Los Alamitos
ISBN
0-7695-1790-0
Book
Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002
Pages from
166
Pages to
173
Pages count
8
URL
https://www.fit.vut.cz/research/publication/6980/
BibTex
@inproceedings{BUT10243, author="Josef {Strnadel} and Zdeněk {Kotásek}", title="Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level", booktitle="Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002", year="2002", pages="166--173", publisher="IEEE Computer Society Press", address="Los Alamitos", isbn="0-7695-1790-0", url="https://www.fit.vut.cz/research/publication/6980/" }