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Detail publikace
STRNADEL, J. KOTÁSEK, Z.
Originální název
Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level
Typ
článek ve sborníku mimo WoS a Scopus
Jazyk
angličtina
Originální abstrakt
In the paper a new heuristic approach to the RTL testability analysis is presented. It is shown how the values of controllability/observability factors reflecting the structure of the circuit and other factors can be utilised to find solutions which are sub-optimal but still acceptable for the designer. The goal of the methodology is to enable the identification of such testability solutions which satisfy concrete requirements in terms of the number of registers included into the scan chain, the area overhead and the test application time as a result of RTL testability analysis. The approach is based on the combination of analytical and evolutionary approaches at the RT level.
Klíčová slova
design for testability, scan technique, scan register, scan chain, state-space analysis, evolutionary approach, genetic algorithm
Autoři
STRNADEL, J.; KOTÁSEK, Z.
Rok RIV
2002
Vydáno
1. 9. 2002
Nakladatel
IEEE Computer Society Press
Místo
Los Alamitos
ISBN
0-7695-1790-0
Kniha
Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002
Strany od
166
Strany do
173
Strany počet
8
URL
https://www.fit.vut.cz/research/publication/6980/
BibTex
@inproceedings{BUT10243, author="Josef {Strnadel} and Zdeněk {Kotásek}", title="Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level", booktitle="Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002", year="2002", pages="166--173", publisher="IEEE Computer Society Press", address="Los Alamitos", isbn="0-7695-1790-0", url="https://www.fit.vut.cz/research/publication/6980/" }