Publication detail

Burn-in empirical evaluation

NOVOTNÝ, R.

Original Title

Burn-in empirical evaluation

Type

conference paper

Language

English

Original Abstract

Particularly in the manufacture of microelectronic devices one of the most important tasks of quality management is the efficient and effective evaluation of modified microelectronic structures reliability and stability. The design of experiments using appropriate software assistance is the appropriate way to solve this problem. For particular reliability and stability criteria this methodology gives the framework for developing a more rigorous understanding of the relationship between structure technological modifications and related parameters.

Key words in English

Burn-in, microelectronic devices, reliability, design of experiments

Authors

NOVOTNÝ, R.

RIV year

2002

Released

1. 9. 2002

Publisher

Ing. Z. Novotny

Location

Brno 2002

ISBN

80-214-2217-3

Book

Socrates Workshop 2002 - Proceedings. Intensive Training Programme in Electronic System Design.

Pages from

78

Pages to

161

Pages count

84

BibTex

@inproceedings{BUT10311,
  author="Radovan {Novotný}",
  title="Burn-in empirical evaluation",
  booktitle="Socrates Workshop 2002 - Proceedings. Intensive Training Programme in Electronic System Design.",
  year="2002",
  pages="84",
  publisher="Ing. Z. Novotny",
  address="Brno 2002",
  isbn="80-214-2217-3"
}