Detail publikace

Burn-in empirical evaluation

NOVOTNÝ, R.

Originální název

Burn-in empirical evaluation

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Particularly in the manufacture of microelectronic devices one of the most important tasks of quality management is the efficient and effective evaluation of modified microelectronic structures reliability and stability. The design of experiments using appropriate software assistance is the appropriate way to solve this problem. For particular reliability and stability criteria this methodology gives the framework for developing a more rigorous understanding of the relationship between structure technological modifications and related parameters.

Klíčová slova v angličtině

Burn-in, microelectronic devices, reliability, design of experiments

Autoři

NOVOTNÝ, R.

Rok RIV

2002

Vydáno

1. 9. 2002

Nakladatel

Ing. Z. Novotny

Místo

Brno 2002

ISBN

80-214-2217-3

Kniha

Socrates Workshop 2002 - Proceedings. Intensive Training Programme in Electronic System Design.

Strany od

78

Strany do

161

Strany počet

84

BibTex

@inproceedings{BUT10311,
  author="Radovan {Novotný}",
  title="Burn-in empirical evaluation",
  booktitle="Socrates Workshop 2002 - Proceedings. Intensive Training Programme in Electronic System Design.",
  year="2002",
  pages="84",
  publisher="Ing. Z. Novotny",
  address="Brno 2002",
  isbn="80-214-2217-3"
}