Publication detail

Possibilities of Secondary Electrons Detection in ESEM

SKŘIVÁNEK, J.

Original Title

Possibilities of Secondary Electrons Detection in ESEM

Type

conference paper

Language

English

Original Abstract

The construction of high quality, artefact – free secondary electron images in the elevated pressure conditions of an environmental scanning electron microscope (ESEM) is nontrivial process. This paper deals with possibilities of secondary electron detection by ionization and scintillation detector. It is shown a new way of using scintillation detector in environmental conditions. At the end of the article we discussed the advantages and disadvantages of these methods

Keywords

Detection, Environmental SEM,

Authors

SKŘIVÁNEK, J.

Released

1. 1. 2003

Publisher

Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno

Location

Brno

ISBN

80-214-2379-X

Book

Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3

Edition number

1

Pages from

529

Pages to

533

Pages count

5

BibTex

@inproceedings{BUT10751,
  author="Jaroslav {Skřivánek}",
  title="Possibilities of Secondary Electrons Detection in ESEM",
  booktitle="Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3",
  year="2003",
  number="1",
  pages="5",
  publisher="Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno",
  address="Brno",
  isbn="80-214-2379-X"
}