Detail publikace

Possibilities of Secondary Electrons Detection in ESEM

SKŘIVÁNEK, J.

Originální název

Possibilities of Secondary Electrons Detection in ESEM

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The construction of high quality, artefact – free secondary electron images in the elevated pressure conditions of an environmental scanning electron microscope (ESEM) is nontrivial process. This paper deals with possibilities of secondary electron detection by ionization and scintillation detector. It is shown a new way of using scintillation detector in environmental conditions. At the end of the article we discussed the advantages and disadvantages of these methods

Klíčová slova

Detection, Environmental SEM,

Autoři

SKŘIVÁNEK, J.

Vydáno

1. 1. 2003

Nakladatel

Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno

Místo

Brno

ISBN

80-214-2379-X

Kniha

Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3

Číslo edice

1

Strany od

529

Strany do

533

Strany počet

5

BibTex

@inproceedings{BUT10751,
  author="Jaroslav {Skřivánek}",
  title="Possibilities of Secondary Electrons Detection in ESEM",
  booktitle="Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3",
  year="2003",
  number="1",
  pages="5",
  publisher="Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno",
  address="Brno",
  isbn="80-214-2379-X"
}