Publication detail

Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

NOVOTNÁ, V. HRUBANOVÁ, K. NEBESÁŘOVÁ, J. KRZYŽÁNEK, V.

Original Title

Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Type

journal article in Scopus

Language

English

Original Abstract

Radiation damage of embedding media was investigated in low voltage scanning transmission electron microscope at energies 10-30 keV.

Keywords

STEM, mass loss, embedding media

Authors

NOVOTNÁ, V.; HRUBANOVÁ, K.; NEBESÁŘOVÁ, J.; KRZYŽÁNEK, V.

RIV year

2014

Released

10. 8. 2014

ISBN

1431-9276

Periodical

MICROSCOPY AND MICROANALYSIS

Year of study

20

Number

S3

State

United States of America

Pages from

1270

Pages to

1271

Pages count

2

BibTex

@article{BUT109068,
  author="NOVOTNÁ, V. and HRUBANOVÁ, K. and NEBESÁŘOVÁ, J. and KRZYŽÁNEK, V.",
  title="Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM",
  journal="MICROSCOPY AND MICROANALYSIS",
  year="2014",
  volume="20",
  number="S3",
  pages="1270--1271",
  doi="10.1017/S1431927614008083",
  issn="1431-9276"
}