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NOVOTNÁ, V. HRUBANOVÁ, K. NEBESÁŘOVÁ, J. KRZYŽÁNEK, V.
Original Title
Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM
Type
journal article in Scopus
Language
English
Original Abstract
Radiation damage of embedding media was investigated in low voltage scanning transmission electron microscope at energies 10-30 keV.
Keywords
STEM, mass loss, embedding media
Authors
NOVOTNÁ, V.; HRUBANOVÁ, K.; NEBESÁŘOVÁ, J.; KRZYŽÁNEK, V.
RIV year
2014
Released
10. 8. 2014
ISBN
1431-9276
Periodical
MICROSCOPY AND MICROANALYSIS
Year of study
20
Number
S3
State
United States of America
Pages from
1270
Pages to
1271
Pages count
2
BibTex
@article{BUT109068, author="NOVOTNÁ, V. and HRUBANOVÁ, K. and NEBESÁŘOVÁ, J. and KRZYŽÁNEK, V.", title="Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM", journal="MICROSCOPY AND MICROANALYSIS", year="2014", volume="20", number="S3", pages="1270--1271", doi="10.1017/S1431927614008083", issn="1431-9276" }