Publication detail

Assessment of Noise Sources in Resistors

KUPAROWITZ, T. KUPAROWITZ, M.

Original Title

Assessment of Noise Sources in Resistors

Type

conference paper

Language

English

Original Abstract

Thermal noise and 1/f noise are investigated at room conditions in three kinds of basic off-the-shelf resistors. Samples of carbon film, metal oxide, and cement fixed wire-wound resistors are evaluated. Measurement setup is created to acquire their noise spectral density. Their Noise Index and Hooge's constant are calculated and their useability in low-noise measurement setup is assessed.

Keywords

thermal noise, 1/f noise, noise index, noise spectral density, metal oxide film resistor, carbon film fixed resistor, cement fixed wire-wound resistor

Authors

KUPAROWITZ, T.; KUPAROWITZ, M.

RIV year

2015

Released

23. 4. 2015

Publisher

Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií

Location

Brno

ISBN

978-80-214-5148-3

Book

Proceedings of the 21st Student Competition Conference

Edition number

1

ISBN

NEUVEDENO

Pages from

418

Pages to

422

Pages count

5

BibTex

@inproceedings{BUT114132,
  author="Tomáš {Kuparowitz} and Martin {Velísek}",
  title="Assessment of Noise Sources in Resistors",
  booktitle="Proceedings of the 21st Student Competition Conference",
  year="2015",
  number="1",
  pages="418--422",
  publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií",
  address="Brno",
  isbn="978-80-214-5148-3"
}