Detail publikace

Assessment of Noise Sources in Resistors

KUPAROWITZ, T. KUPAROWITZ, M.

Originální název

Assessment of Noise Sources in Resistors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Thermal noise and 1/f noise are investigated at room conditions in three kinds of basic off-the-shelf resistors. Samples of carbon film, metal oxide, and cement fixed wire-wound resistors are evaluated. Measurement setup is created to acquire their noise spectral density. Their Noise Index and Hooge's constant are calculated and their useability in low-noise measurement setup is assessed.

Klíčová slova

thermal noise, 1/f noise, noise index, noise spectral density, metal oxide film resistor, carbon film fixed resistor, cement fixed wire-wound resistor

Autoři

KUPAROWITZ, T.; KUPAROWITZ, M.

Rok RIV

2015

Vydáno

23. 4. 2015

Nakladatel

Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií

Místo

Brno

ISBN

978-80-214-5148-3

Kniha

Proceedings of the 21st Student Competition Conference

Číslo edice

1

ISSN

NEUVEDENO

Strany od

418

Strany do

422

Strany počet

5

BibTex

@inproceedings{BUT114132,
  author="Tomáš {Kuparowitz} and Martin {Velísek}",
  title="Assessment of Noise Sources in Resistors",
  booktitle="Proceedings of the 21st Student Competition Conference",
  year="2015",
  number="1",
  pages="418--422",
  publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií",
  address="Brno",
  isbn="978-80-214-5148-3"
}