Publication detail

Simulation of the cantilever used as a weak force sensor in Atomic Force Microscopy

HROUZEK, M.

Original Title

Simulation of the cantilever used as a weak force sensor in Atomic Force Microscopy

Type

conference paper

Language

English

Original Abstract

New types of weak forces measurements with Atomic Force Microscope (AFM) are very challenging for experimental physics and call for new studies about controllers operating the AFM. For the development of improved regulators applied into control systems is needed precise model of the cantilever with a sharp tip, as a detection system, and its interaction with the scanned sample. This paper presents a model of the cantilever, that is based at the beam theory with the in°uence of the long distance interaction forces.

Key words in English

cantilever, weak force, sensor

Authors

HROUZEK, M.

RIV year

2004

Released

1. 1. 2004

Publisher

VUT v Brně, Antonínská 548/1

Location

Brno

ISBN

80-214-2701-9

Book

ELECTRONIC DEVICES AND SYSTEMS 04 - PROCEEDINGS

Edition

1

Edition number

1

Pages from

1

Pages to

5

Pages count

5

BibTex

@inproceedings{BUT11551,
  author="Michal {Hrouzek}",
  title="Simulation of the cantilever used as a weak force sensor in Atomic Force Microscopy",
  booktitle="ELECTRONIC DEVICES AND SYSTEMS 04 - PROCEEDINGS",
  year="2004",
  series="1",
  number="1",
  pages="5",
  publisher="VUT v Brně, Antonínská 548/1",
  address="Brno",
  isbn="80-214-2701-9"
}